Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12347723 | Semiconductor device | — | 2025-07-01 |
| 11848228 | Semiconductor device | — | 2023-12-19 |
| 11004731 | Semiconductor device | — | 2021-05-11 |
| 10770471 | Semiconductor device | Kojiro Shimizu, Hanae ISHIHARA | 2020-09-08 |
| 10115627 | Semiconductor device | — | 2018-10-30 |
| 9831270 | Nonvolatile semiconductor memory device and method for manufacturing the same | Gaku Sudo | 2017-11-28 |
| 8126257 | Alignment of semiconductor wafer patterns by corresponding edge groups | Tadashi Mitsui | 2012-02-28 |
| 7787687 | Pattern shape evaluation apparatus, pattern shape evaluation method, method of manufacturing semiconductor device, and program | Tadashi Mitsui | 2010-08-31 |
| 7418363 | Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded | Takahiro Ikeda | 2008-08-26 |
| 7321680 | Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system | Takahiro Ikeda | 2008-01-22 |
| 6963819 | Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded | Takahiro Ikeda | 2005-11-08 |
| 6772089 | Graphic contour extracting method, pattern inspecting method, program and pattern inspecting system | Takahiro Ikeda | 2004-08-03 |
| 6647147 | Method for measuring fine pattern, apparatus for measuring fine pattern, and record medium that can store therein program to measure fine pattern and can be read by using computer | — | 2003-11-11 |
| 6480807 | Micropattern measuring method and apparatus, and recording medium that records micropattern measuring program | — | 2002-11-12 |
| 6363167 | Method for measuring size of fine pattern | Fumio Komatsu | 2002-03-26 |