Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8208325 | Semiconductor device, semiconductor package and memory repair method | Yukihiro Urakawa | 2012-06-26 |
| 8130570 | Data transfer circuit | Akihiko Fukui | 2012-03-06 |
| 7797600 | Method and apparatus for testing a ring of non-scan latches with logic built-in self-test | Louis Bernard Bushard, Nathan P. Chelstrom, David J. Krolak | 2010-09-14 |
| 7681098 | Systems and methods for improved fault coverage of LBIST testing | — | 2010-03-16 |
| 7631237 | Multi-test method for using compare MISR | — | 2009-12-08 |
| 7627798 | Systems and methods for circuit testing using LBIST | — | 2009-12-01 |
| 7558996 | Systems and methods for identifying errors in LBIST testing | — | 2009-07-07 |
| 7484153 | Systems and methods for LBIST testing using isolatable scan chains | Mack W. Riley, Nathan P. Chelstrom | 2009-01-27 |
| 7478304 | Apparatus for accelerating through-the-pins LBIST simulation | Tilman Gloekler, Christian Habermann, Joachim Kneisel, Johannes Koesters | 2009-01-13 |
| 7475311 | Systems and methods for diagnosing rate dependent errors using LBIST | — | 2009-01-06 |
| 7461309 | Systems and methods for providing output data in an LBIST system having a limited number of output ports | — | 2008-12-02 |
| 7406640 | Method and apparatus for testing a ring of non-scan latches with logic built-in self-test | Louis Bernard Bushard, Nathan P. Chelstrom, David J. Krolak | 2008-07-29 |
| 7350124 | Method and apparatus for accelerating through-the pins LBIST simulation | Tilman Gloekler, Christian Habermann, Joachim Kneisel, Johannes Koesters | 2008-03-25 |
| 7308634 | Systems and methods for LBIST testing using multiple functional subphases | — | 2007-12-11 |
| 7266745 | Programmable scan shift speed control for LBIST | — | 2007-09-04 |
| 7103495 | System and method for burn-in test control | — | 2006-09-05 |
| 7080298 | Circuit apparatus and method for testing integrated circuits using weighted pseudo-random test patterns | Louis Bernard Bushard | 2006-07-18 |
| 7055077 | Systems and methods for circuit testing | Louis Bernard Bushard | 2006-05-30 |