HT

Hiroyoshi Tanimoto

KT Kabushiki Kaisha Toshiba: 16 patents #1,863 of 21,451Top 9%
IBM: 1 patents #44,794 of 70,183Top 65%
Overall (All Time): #275,715 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
9595324 Semiconductor memory device Hiroki TOKUHIRA, Takashi Izumida 2017-03-14
9502103 Semiconductor memory device Takashi Izumida 2016-11-22
9136468 Nonvolatile semiconductor memory device Tsukasa Nakai, Masaki Kondo, Nobutoshi Aoki 2015-09-15
9030881 Nonvolatile semiconductor memory device Hiroki TOKUHIRA, Tsukasa Nakai, Masaki Kondo, Toshiyuki Enda, Nobutoshi Aoki 2015-05-12
8610282 Semiconductor device and method of manufacturing the same Takashi KURUSU, Takashi Izumida, Nobutoshi Aoki 2013-12-17
7786523 Capacitor of dynamic random access memory and method of manufacturing the capacitor Yumi Hayashi, Hayato Nasu, Kazumichi Tsumura, Takamasa Usui 2010-08-31
7755134 Nonvolatile semiconductor memory device Masaru Kito, Nobutoshi Aoki, Masaru Kidoh, Ryota Katsumata, Masaki Kondo +6 more 2010-07-13
7638829 Capacitor of dynamic random access memory and method of manufacturing the capacitor Yumi Hayashi, Hayato Nasu, Kazumichi Tsumura, Takamasa Usui 2009-12-29
7539055 Non-volatile semiconductor memory and method for controlling a non-volatile semiconductor memory Toshiyuki Enda, Naoki Kusunoki, Nobutoshi Aoki, Fumitaka Arai, Riichiro Shirota 2009-05-26
7528447 Non-volatile semiconductor memory and method for controlling a non-volatile semiconductor memory Toshiyuki Enda, Naoki Kusunoki, Nobutoshi Aoki, Fumitaka Arai, Riichiro Shirota 2009-05-05
7459748 Semiconductor memory device Riichiro Shirota, Fumitaka Arai, Toshiyuki Enda, Naoki Kusunoki, Nobutoshi Aoki +3 more 2008-12-02
7393748 Method of fabricating a semiconductor memory device Fumitaka Arai, Toshiyuki Enda, Naoki Kusunoki, Nobutoshi Aoki, Riichiro Shirota +2 more 2008-07-01
6784006 Semiconductor device, method of manufacturing semiconductor device, and system for evaluating electrical characteristics of semiconductor device Toshiyuki Enda 2004-08-31
6195790 Electrical parameter evaluation system, electrical parameter evaluation method, and computer-readable recording medium for recording electrical parameter evaluation program Toshiyuki Enda, Naoyuki Shigyo, Kazuya Matsuzawa 2001-02-27
5905279 Low resistant trench fill for a semiconductor device Akihiro Nitayama 1999-05-18
5763918 ESD structure that employs a schottky-barrier to reduce the likelihood of latch-up Badih El-Kareh, James G. Ryan 1998-06-09
5463234 High-speed semiconductor gain memory cell with minimal area occupancy Akira Toriumi, Naoyuki Shigyo, Tetsunori Wada, Kazuya Ohuchi, Makoto Yoshimi 1995-10-31