Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6934036 | Configuration measuring apparatus and method | Keishi Kubo, Hiroyuki Takeuchi, Kouji Handa, Keiichi Yoshizumi | 2005-08-23 |
| 6480286 | Method and apparatus for measuring thickness variation of a thin sheet material, and probe reflector used in the apparatus | Keishi Kubo, Keiichi Yoshizumi, Hiroyuki Takeuchi, Koji Handa | 2002-11-12 |
| 6026583 | Shape measuring apparatus and method | Keiichi Yoshizumi, Hiroyuki Takeuchi, Keishi Kubo, Koji Handa | 2000-02-22 |