XS

Xiaoxin Shang

AB Asml Netherlands B.V.: 1 patents #2,025 of 3,192Top 65%
Overall (All Time): #2,777,009 of 4,157,543Top 70%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10571363 Method of determining an optimal focus height for a metrology apparatus Mariya Vyacheslavivna Medvedyeva, Anagnostis Tsiatmas, Hugo Augustinus Joseph Cramer, Martinus Hubertus Maria Van Weert, Bastiaan Onne Fagginger Auer +2 more 2020-02-25