Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5808745 | Method for measuring a substitutional carbon concentration | Hiroshi Shirai, Mikio Watanabe | 1998-09-15 |
| 5287167 | Method for measuring interstitial oxygen concentration | Hiroshi Shirai, Mikio Watanabe | 1994-02-15 |
| 4479297 | Method of fabricating three-dimensional semiconductor devices utilizing CeO.sub.2 and ion-implantation. | Yoshihisa Mizutani | 1984-10-30 |
| 4411013 | System for transferring a fine pattern onto a target | Toshiaki Shinozaki | 1983-10-18 |
| 4378269 | Method of manufacturing a single crystal silicon rod | Yoshiaki Matsushita, Seigo Kishino | 1983-03-29 |
| 4291990 | Apparatus for measuring the distribution of irregularities on a mirror surface | — | 1981-09-29 |