Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7126194 | Method for removing impurities of a semiconductor wafer, semiconductor wafer assembly, and semiconductor device | Hideki Tsuya | 2006-10-24 |
| 4378269 | Method of manufacturing a single crystal silicon rod | Yoshiaki Matsushita, Shinichiro Takasu | 1983-03-29 |
| 4376657 | Method of making fault-free surface zone in semiconductor devices by step-wise heat treating | Kazutoshi Nagasawa, Yoshiaki Matsushita, Masaru Kanamori | 1983-03-15 |
| 4314595 | Method of forming nondefective zone in silicon single crystal wafer by two stage-heat treatment | Kazuhiko Yamamoto, Yoshiaki Matsushita, Masaru Kanamori, Kazutoshi Nagasawa, Naotsugu Yoshihiro | 1982-02-09 |