Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4376657 | Method of making fault-free surface zone in semiconductor devices by step-wise heat treating | Seigo Kishino, Yoshiaki Matsushita, Masaru Kanamori | 1983-03-15 |
| 4314595 | Method of forming nondefective zone in silicon single crystal wafer by two stage-heat treatment | Kazuhiko Yamamoto, Yoshiaki Matsushita, Masaru Kanamori, Naotsugu Yoshihiro, Seigo Kishino | 1982-02-09 |