YM

Yuichi Madokoro

HI Hitachi: 15 patents #2,636 of 28,497Top 10%
HH Hitachi High-Technologies: 10 patents #266 of 1,917Top 15%
HS Hitachi High-Tech Science: 1 patents #94 of 167Top 60%
Overall (All Time): #144,741 of 4,157,543Top 4%
27
Patents All Time

Issued Patents All Time

Showing 25 most recent of 27 patents

Patent #TitleCo-InventorsDate
11682536 Particle beam apparatus and composite beam apparatus Koji Nagahara 2023-06-20
8710464 Specimen preparation device, and control method in specimen preparation device Tsuyoshi Onishi, Megumi Aizawa, Yukio Yoshizawa 2014-04-29
8629394 Charged particle beam device and method for correcting position with respect to charged particle beam Megumi Aizawa, Yukio Yoshizawa 2014-01-14
8569719 Method and apparatus for specimen fabrication Satoshi Tomimatsu, Kaoru Umemura, Yoshimi Kawanami, Yasunori Doi 2013-10-29
8552397 Focused ion beam device and focused ion beam processing method Hirokazu Kaneoya, Tsuyoshi Onishi, Isamu Sekihara 2013-10-08
8405053 Method and apparatus for specimen fabrication Satoshi Tomimatsu, Kaoru Umemura, Yoshimi Kawanami, Yasunori Doi 2013-03-26
7999240 Method and apparatus for specimen fabrication Satoshi Tomimatsu, Kaoru Umemura, Yoshimi Kawanami, Yasunori Doi 2011-08-16
7804073 Liquid metal ion gun Hiroyasu Kaga, Shigeru Izawa, Tohru Ishitani, Kaoru Umemura 2010-09-28
7791050 Method and apparatus for specimen fabrication Satoshi Tomimatsu, Kaoru Umemura, Yoshimi Kawanami, Yasunori Doi 2010-09-07
7525108 Focused ion beam apparatus for specimen fabrication Satoshi Tomimatsu, Kaoru Umemura, Yoshimi Kawanami, Yasunori Doi 2009-04-28
7435972 Focused ion beam apparatus and liquid metal ion source Shigeru Izawa, Kaoru Umemura, Hiroyasu Kaga 2008-10-14
7420181 Liquid metal ion gun Hiroyasu Kaga, Shigeru Izawa, Tohru Ishitani, Kaoru Umemura 2008-09-02
7397051 Method and apparatus for specimen fabrication Satoshi Tomimatsu, Kaoru Umemura, Yoshimi Kawanami, Yasunori Doi 2008-07-08
7397050 Method and apparatus for specimen fabrication Satoshi Tomimatsu, Kaoru Umemura, Yoshimi Kawanami, Yasunori Doi 2008-07-08
7397052 Method and apparatus for specimen fabrication Satoshi Tomimatsu, Kaoru Umemura, Yoshimi Kawanami, Yasunori Doi 2008-07-08
7235798 Focused ion beam apparatus Tohru Ishitani, Hiroyuki Muto 2007-06-26
7211805 Liquid metal ion gun Hiroyasu Kaga, Shigeru Izawa, Tohru Ishitani, Kaoru Umemura 2007-05-01
7189982 Focused ion beam apparatus and aperture Shigeru Izawa, Kaoru Umemura, Hiroyasu Kaga 2007-03-13
7176458 Method and apparatus for specimen fabrication Satoshi Tomimatsu, Kaoru Umemura, Yoshimi Kawanami, Yasunori Doi 2007-02-13
7138628 Method and apparatus for specimen fabrication Satoshi Tomimatsu, Kaoru Umemura, Yoshimi Kawanami, Yasunori Doi 2006-11-21
7084399 Ion beam apparatus and sample processing method Hiroyuki Muto, Tohru Ishitani 2006-08-01
7071475 Method and apparatus for specimen fabrication Satoshi Tomimatsu, Kaoru Umemura, Yoshimi Kawanami, Yasunori Doi 2006-07-04
7005651 Liquid metal ion gun Hiroyasu Kaga, Shigeru Izawa, Tohru Ishitani, Kaoru Umemura 2006-02-28
6828566 Method and apparatus for specimen fabrication Satoshi Tomimatsu, Kaoru Umemura, Yoshimi Kawanami, Yasunori Doi 2004-12-07
6822245 Ion beam apparatus and sample processing method Hiroyuki Muto, Tohru Ishitani 2004-11-23