YM

Yoshiyuki Masuo

AD Advantest: 7 patents #131 of 1,193Top 15%
Overall (All Time): #747,949 of 4,157,543Top 20%
7
Patents All Time

Issued Patents All Time

Showing 1–7 of 7 patents

Patent #TitleCo-InventorsDate
7919974 Electronic device test apparatus and method of configuring electronic device test apparatus Kazuyuki Yamashita 2011-04-05
6856128 Semiconductor device testing apparatus and a test tray for use in the testing apparatus Akihiko Ito, Yoshihito Kobayashi, Tsuyoshi Yamashita 2005-02-15
6459259 Tester for semiconductor devices and test tray used for the same Akihiko Ito, Yoshihito Kobayashi, Tsuyoshi Yamashita 2002-10-01
6384593 Semiconductor device testing apparatus Yoshihito Kobayashi, Tsuyoshi Yamashita, Hiroto Nakamura, Shin Nemoto, Akihiko Ito 2002-05-07
6384360 IC pickup, IC carrier and IC testing apparatus using the same Yoshihito Kobayashi 2002-05-07
D442568 IC module insert Toshiyuki Kiyokawa, Hiroyuki Takahashi 2001-05-22
6104183 Semiconductor device testing apparatus Yoshihito Kobayashi, Tsuyoshi Yamashita, Hiroto Nakamura, Shin Nemoto, Akihiko Ito 2000-08-15