Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9824852 | CD-SEM technique for wafers fabrication control | Roman Kris, Yakov Weinberg, Ishai Schwarzband, Dan Lange, Arbel Englander +3 more | 2017-11-21 |
| 9715724 | Registration of CAD data with SEM images | Ishai Schwarzband, Daniel Ravid, Orly ZVITIA, Idan Kaizerman | 2017-07-25 |
| 8724891 | Apparatus and methods for the detection of abnormal motion in a video stream | Nahum Kiryati, Tamar Riklin-Raviv, Shay Rochel, Igal Dvir, Daniel Harari | 2014-05-13 |
| 8538130 | CD metrology system and method of classifying similar structural elements | Adi Costa | 2013-09-17 |