VS

Vitali Sokhin

IBM: 19 patents #5,782 of 70,183Top 9%
Samsung: 2 patents #37,631 of 75,807Top 50%
SY Synopsys: 1 patents #1,143 of 2,302Top 50%
Overall (All Time): #217,503 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
11928051 Test space sampling for model-based biased random system test through rest API Gil Eliezer Shurek, Shiri Moran, Tom Kolan 2024-03-12
11796593 Compiler-based code generation for post-silicon validation Hillel Mendelson, Tom Kolan, Shay Aviv, Wesam Saleem Ibraheem 2023-10-24
11748238 Model-based biased random system test through rest API Dean G. Bair, Gil Eliezer Shurek, Shiri Moran, Tom Kolan 2023-09-05
11263150 Testing address translation cache Hillel Mendelson, Tom Kolan 2022-03-01
11226370 Recoverable exceptions generation and handling for post-silicon validation Hillel Mendelson, Tom Kolan, Hernan Theiler, Shai Doron 2022-01-18
11204859 Partial-results post-silicon hardware exerciser Tom Kolan, Alex Lvovsky, Hillel Mendelson 2021-12-21
11200126 Utilizing translation tables for testing processors Tom Kolan, Hillel Mendelson, Shay Aviv 2021-12-14
11194705 Automatically introducing register dependencies to tests Hillel Mendelson, Tom Kolan 2021-12-07
11182265 Method and apparatus for test generation Tom Kolan, Hillel Mendelson 2021-11-23
10983887 Validation of multiprocessor hardware component Sung-Boem Park, Amir Nahir, Wisam Kadry, Jin-Sung Park, Ara Cho 2021-04-20
10891163 Attribute driven memory allocation Shai Doron, Wesam Saleem Ibraheem, Hernan Theiler, Hagai Hadad 2021-01-12
10528443 Validation of multiprocessor hardware component Sung-Boem Park, Amir Nahir, Wisam Kadry, Jin-Sung Park, Ara Cho 2020-01-07
10496449 Verification of atomic memory operations Tom Kolan, Hillel Mendelson 2019-12-03
10282232 Attribute driven memory allocation Shai Doron, Wesam Saleem Ibraheem, Hernan Theiler, Hagai Hadad 2019-05-07
9633155 Circuit modification Wesam Saleem Ibraheem, Tom Kolan, Anatoly Koyfman, Ronny Morad, Elena Tsanko 2017-04-25
9626267 Test generation using expected mode of the target hardware device Sung-Boem Park, Amir Nahir, Wisam Kadry, Jin-Sung Park, Ara Cho 2017-04-18
9569345 Architectural failure analysis Ophir Friedler, Wisam Kadry, Amir Nahir 2017-02-14
9251045 Control flow error localization Ophir Friedler, Wisam Kadry, Amir Nahir 2016-02-02
8892386 Method and apparatus for post-silicon testing Allon Adir, Eyal Bin, Shady Copty, Anatoly Koyfman, Shimon Landa +2 more 2014-11-18
8832502 Hardware verification using acceleration platform Manoj Dusanapudi, Wisam Kadry, Shakti Kapoor, Dimtry Krestyashyn, Shimon Landa +3 more 2014-09-09