Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8921781 | Measurement or inspecting apparatus | Go Miya, Seiichiro Kanno, Hiroyuki Kitsunai, Masaru Matsushima | 2014-12-30 |
| 8680466 | Electron microscope, and specimen holding method | Seiichiro Kanno, Hiroyuki Kitsunai, Masaru Matsushima, Kazuyuki Ikenaga | 2014-03-25 |
| 8519332 | Semiconductor inspecting apparatus | Go Miya, Seiichiro Kanno, Hiroyuki Kitsunai, Masaru Matsushima | 2013-08-27 |
| 8232522 | Semiconductor inspecting apparatus | Go Miya, Seiichiro Kanno, Hiroyuki Kitsunai, Masaru Matsushima | 2012-07-31 |