Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7432628 | Generator and method of manufacturing same | Juichi Enyama | 2008-10-07 |
| 6977514 | Probe structure | Ryuji Kohno, Tatsuya Nagata, Hiroya Shimizu, Hideo Miura | 2005-12-20 |
| 6885208 | Semiconductor device and test device for same | Tatsuya Nagata, Hiroya Shimizu, Ryuji Kohno, Hideyuki Aoki | 2005-04-26 |
| 6864568 | Packaging device for holding a plurality of semiconductor devices to be inspected | Ryuji Kohno, Hiroya Shimizu, Masatoshi Kanamaru, Atsushi Hosogane, Hideo Miura +4 more | 2005-03-08 |
| 6774654 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Hideyuki Aoki +1 more | 2004-08-10 |
| 6614246 | Probe structure | Ryuji Kohno, Tatsuya Nagata, Hiroya Shimizu, Hideo Miura | 2003-09-02 |
| 6496023 | Semiconductor-device inspecting apparatus and a method for manufacturing the same | Masatoshi Kanamaru, Yoshishige Endo, Takanorr Aono, Ryuji Kohno, Hideyuki Aoki +1 more | 2002-12-17 |
| 6465264 | Method for producing semiconductor device and apparatus usable therein | Ryuji Kohno, Hiroya Shimizu, Masatoshi Kanamaru, Atsushi Hosogane, Hideo Miura +4 more | 2002-10-15 |