Issued Patents All Time
Showing 1–25 of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12141974 | System and method for determining a feature grade for a peritumoral feature of an optoacoustic image | Anthony Thomas Stavros, Reni S. Butler, Philip T. Lavin, Jason Zalev | 2024-11-12 |
| 11651489 | System and method for diagnostic vector classification support | Anthony Thomas Stavros, Reni S. Butler, Philip T. Lavin, Jason Zalev | 2023-05-16 |
| 10949967 | System and method for diagnostic vector classification support | Anthony Thomas Stavros, Reni S. Butler, Philip T. Lavin, Jason Zalev | 2021-03-16 |
| 10026170 | System and method for diagnostic vector classification support | Anthony Thomas Stavros, Reni S. Butler, Philip T. Lavin, Jason Zalev | 2018-07-17 |
| 9398893 | System and method for diagnostic vector classification support | Anthony Thomas Stavros, Reni S. Butler, Philip T. Lavin, Jason Zalev | 2016-07-26 |
| 9163980 | Light output calibration in an optoacoustic system | Donald G. Herzog, Elisa Gravis, Bryan Clingman, Remie J. Smith | 2015-10-20 |
| 9046344 | Multiple image metrology | — | 2015-06-02 |
| 8823928 | Light output calibration in an optoacoustic system | Donald G. Herzog, Elisa Gravis, Bryan Clingman, Remie J. Smith | 2014-09-02 |
| 7719294 | Systems configured to perform a non-contact method for determining a property of a specimen | Amin Samsavar, John M. Schmidt, Rainer Schierle, Gregory S. Horner, Zhiwei Xu +3 more | 2010-05-18 |
| 7538333 | Contactless charge measurement of product wafers and control of corona generation and deposition | Amin Samsavar, John M. Schmidt, Rainer Schierle, Gregory S. Horner, Zhiwei Xu +3 more | 2009-05-26 |
| 7397254 | Methods for imperfect insulating film electrical thickness/capacitance measurement | Xiafang Zhang, Zhiwei Xu, Jianou Shi, Quoc Vu, Gregory S. Horner | 2008-07-08 |
| 7358748 | Methods and systems for determining a property of an insulating film | Gregory S. Horner, Amin Samsavar, Zhiwei Xu, Patrick Stevens | 2008-04-15 |
| 7248062 | Contactless charge measurement of product wafers and control of corona generation and deposition | Amin Samsavar, John M. Schmidt, Rainer Schierle, Gregory S. Horner, Zhiwei Xu +3 more | 2007-07-24 |
| 7075318 | Methods for imperfect insulating film electrical thickness/capacitance measurement | Xiafang Zhang, Zhiwei Xu, Jianou Shi, Bao Vu, Gregory S. Horner | 2006-07-11 |
| 7064565 | Methods and systems for determining an electrical property of an insulating film | Zhiwei Xu, Jianou Shi, Gregory S. Horner | 2006-06-20 |
| 7012438 | Methods and systems for determining a property of an insulating film | Gregory S. Horner, Amin Samsavar, Zhiwei Xu, Patrick Stevens | 2006-03-14 |
| 6759255 | Method and system for detecting metal contamination on a semiconductor wafer | Zhiwei Xu, Arun Ramaswamy SRIVATSA, Amin Samsavar, Greg Horner, Steven M. Weinzierl | 2004-07-06 |
| 6734696 | Non-contact hysteresis measurements of insulating films | Gregory S. Horner | 2004-05-11 |
| RE36201 | High energy x-y neutron detector and radiographic/tomographic device | — | 1999-04-27 |
| 5880469 | Method and apparatus for a directional neutron detector which discriminates neutrons from gamma rays | — | 1999-03-09 |
| 5785044 | Fluid sample receptacle | James W. Meador, Thomas L. Kraft, David P. O'Bryan, John F. Berry, Norman Hugh Smith +4 more | 1998-07-28 |
| 5606167 | Contraband detection apparatus and method | — | 1997-02-25 |
| 5594247 | Apparatus and method for depositing charge on a semiconductor wafer | Roger L. Verkuil, Gregory S. Horner | 1997-01-14 |
| 5549141 | Liquid container sample transfer method and apparatus | James W. Meador, Thomas L. Kraft | 1996-08-27 |
| 5411065 | Liquid specimen transfer apparatus and method | James W. Meador, Christopher T. Nikirk, Louis A. Waters, Jr., Sean M. Donnelly | 1995-05-02 |