Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12429418 | Phase-resolved optical metrology for substrates | Nedal Saleh, Zhiming Jiang, Xiaodong Zhang | 2025-09-30 |
| 6759255 | Method and system for detecting metal contamination on a semiconductor wafer | Zhiwei Xu, Amin Samsavar, Thomas G. Miller, Greg Horner, Steven M. Weinzierl | 2004-07-06 |