Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12429418 | Phase-resolved optical metrology for substrates | Zhiming Jiang, Xiaodong Zhang, Arun Ramaswamy SRIVATSA | 2025-09-30 |
| 10832895 | Stand alone microfluidic analytical chip device | Waqas Khalid, Faisal Saleh | 2020-11-10 |
| 10497541 | Apparatus and method for programmable spatially selective nanoscale surface functionalization | Waqas Khalid, Faisal Saleh | 2019-12-03 |
| 9091942 | Scatterometry measurement of line edge roughness in the bright field | — | 2015-07-28 |
| 8869081 | Automating integrated circuit device library generation in model based metrology | Alok Vaid | 2014-10-21 |
| 8860956 | Spectrometry employing extinction coefficient modulation | Yunlin Zhang | 2014-10-14 |