Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7872745 | Pattern inspection apparatus and pattern inspection method | Takayuki Abe, Tomohiro Iijima, Hideo Tsuchiya | 2011-01-18 |
| 4870693 | Mask inspecting apparatus | Shigeru Takemoto, Yoshihiko Fujimori | 1989-09-26 |