Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7795593 | Surface contamination analyzer for semiconductor wafers | Keizo Yamada, Yohsuke Itagaki, Tohru Tsujide | 2010-09-14 |
| 7700380 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Keizo Yamada, Yohsuke Itagaki, Tohru Tsujide | 2010-04-20 |
| 7385195 | Semiconductor device tester | Keizo Yamada, Yousuke Itagaki, Tohru Tsujide | 2008-06-10 |
| 7321805 | Production managing system of semiconductor device | Keizo Yamada, Yousuke Itagaki, Tohru Tsujide | 2008-01-22 |
| 7002361 | Film thickness measuring apparatus and a method for measuring a thickness of a film | Keizo Yamada, Yousuke Itagaki | 2006-02-21 |
| 6975125 | Semiconductor device tester | Keizo Yamada, Yousuke Itagaki, Tohru Tsujide | 2005-12-13 |
| 6946857 | Semiconductor device tester | Keizo Yamada, Yousuke Itagaki, Tohru Tsujide | 2005-09-20 |
| 6943043 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Keizo Yamada, Yohsuke Itagaki, Tohru Tsujide | 2005-09-13 |
| 6850079 | Film thickness measuring apparatus and a method for measuring a thickness of a film | Keizo Yamada, Yousuke Itagaki | 2005-02-01 |
| 6842663 | Production managing system of semiconductor device | Keizo Yamada, Yousuke Itagaki, Tohru Tsujide | 2005-01-11 |
| 6837936 | Semiconductor manufacturing device | Keizo Yamada, Yousuke Itagaki | 2005-01-04 |
| 6768324 | Semiconductor device tester which measures information related to a structure of a sample in a depth direction | Keizo Yamada, Tohru Tsujide, Yousuke Itagaki | 2004-07-27 |
| 6753194 | Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device | Keizo Yamada, Yohsuke Itagaki, Tohru Tsujide | 2004-06-22 |
| 6711453 | Production managing system of semiconductor device | Keizo Yamada, Yousuke Itagaki, Tohru Tsujide | 2004-03-23 |
| 6683308 | Method and apparatus for measuring thickness of thin film | Yosuke Itagaki, Keizo Yamada | 2004-01-27 |
| 6614244 | Semiconductor device inspecting apparatus | Keizo Yamada, Yousuke Itagaki, Tohru Tsujide | 2003-09-02 |
| 6559662 | Semiconductor device tester and semiconductor device test method | Keizo Yamada, Yousuke Itagaki, Tohru Tsujide | 2003-05-06 |
| 6258244 | Treating method and apparatus utilizing chemical reaction | Tadahiro Ohmi, Nobuyoshi Tanaka, Toshikuni Shinohara, Takahisa Nitta | 2001-07-10 |
| 6255731 | SOI bonding structure | Tadahiro Ohmi, Nobuyoshi Tanaka, Toshikuni Shinohara, Takahisa Nitta | 2001-07-03 |