TU

Takahiro Urano

HH Hitachi High-Technologies: 13 patents #452 of 1,917Top 25%
MI Mikuni: 1 patents #91 of 198Top 50%
Overall (All Time): #331,493 of 4,157,543Top 8%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
12235223 Method for defect inspection, system, and computer-readable medium Takanori Kondo, Nobuhiro Obara 2025-02-25
12112963 Defect inspection apparatus and defect inspection program Takashi Hiroi, Nobuaki Hirose 2024-10-08
12039716 Defect inspection method and defect inspection device Takashi Hiroi, Nobuaki Hirose 2024-07-16
11981202 Accelerator pedal device Jun Nagashima, Satoshi Miyazaki 2024-05-14
11788973 Defect inspection device and defect inspection method Takashi Hiroi, Nobuaki Hirose 2023-10-17
11041815 Inspection information generation device, inspection information generation method, and defect inspection device Toshifumi Honda, Takashi Hiroi, Nobuaki Hirose 2021-06-22
10861145 Defect inspection device and defect inspection method Toshifumi Honda, Hisashi Hatano, Hironori Sakurai 2020-12-08
10816484 Flaw inspection device and flaw inspection method Toshifumi Honda, Mamoru Kobayashi, Hisashi Hatano, Hironori Sakurai 2020-10-27
10466181 Flaw inspection device and flaw inspection method Toshifumi Honda, Mamoru Kobayashi, Hisashi Hatano, Hironori Sakurai 2019-11-05
9865046 Defect inspection method and defect inspection device Toshifumi Honda 2018-01-09
9778206 Defect inspection device and defect inspection method Toshifumi Honda, Hidetoshi Nishiyama 2017-10-03
9075026 Defect inspection device and defect inspection method Kaoru Sakai, Toshifumi Honda 2015-07-07
8908172 Defect inspection device and method of inspecting defect Toshifumi Honda 2014-12-09
8737718 Apparatus and method for inspecting defect Kaoru Sakai 2014-05-27