Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11557457 | Charged particle beam apparatus | Kosuke Matsumoto, Satoshi Takada, Hirohiko Kitsuki, Kazuo Aoki | 2023-01-17 |
| 11195694 | Charged particle beam system, method for determining range for automatically searching for focal point position in charged particle beam device, and non-transitory storage medium recording program for causing computer system to determine range for automatically searching for focal position in charged particle beam device | Kosuke Matsumoto, Hirohiko Kitsuki, Kenji Obara | 2021-12-07 |
| 10770260 | Defect observation device | Yuko Otani, Yohei Minekawa, Nobuhiko KANZAKI, Takehiro Hirai, Miyuki Fukuda +3 more | 2020-09-08 |