Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10324046 | Methods and systems for monitoring a non-defect related characteristic of a patterned wafer | Tao-Yi Fu, Steve R. Lange, Lisheng Gao, Xuguang Jiang, Ping Gu | 2019-06-18 |
| 9735022 | Arrays of long nanostructures in semiconductor materials and methods thereof | Mingqiang Yi, Matthew L. Scullin, Gabriel A. Matus, Dawn L. Hilken, Chii Guang Lee | 2017-08-15 |
| 9514931 | Low thermal conductivity matrices with embedded nanostructures and methods thereof | Mingqiang Yi, Gabriel A. Matus, Matthew L. Scullin, Chii Guang Lee | 2016-12-06 |
| 9240328 | Arrays of long nanostructures in semiconductor materials and methods thereof | Mingqiang Yi, Matthew L. Scullin, Gabriel A. Matus, Dawn L. Hilken, Chii Guang Lee | 2016-01-19 |
| 8736011 | Low thermal conductivity matrices with embedded nanostructures and methods thereof | Mingqiang Yi, Gabriel A. Matus, Matthew L. Scullin, Chii Guang Lee | 2014-05-27 |
| 7623228 | Front face and edge inspection | — | 2009-11-24 |