| 12167599 |
Memory device including multiple decks of memory cells and pillars extending through the decks |
Darwin A. Clampitt, Matthew J. King, Lisa M. Clampitt, John D. Hopkins, Kevin Y. Titus +5 more |
2024-12-10 |
| 11869178 |
System for predicting properties of structures, imager system, and related methods |
Amitava Majumdar, Qianlan Liu, Pradeep Ramachandran, Steve K. McCandless, Ted Taylor +2 more |
2024-01-09 |
| 11532638 |
Memory device including multiple decks of memory cells and pillars extending through the decks |
Darwin A. Clampitt, Matthew J. King, Lisa M. Clampitt, John D. Hopkins, Kevin Y. Titus +5 more |
2022-12-20 |
| 11508746 |
Semiconductor device having a stack of data lines with conductive structures on both sides thereof |
Darwin A. Clampitt, Roger W. Lindsay, Christopher R. Ritchie, Matthew J. King, Lisa M. Clampitt |
2022-11-22 |
| 10872403 |
System for predicting properties of structures, imager system, and related methods |
Amitava Majumdar, Qianlan Liu, Pradeep Ramachandran, Steve K. McCandless, Ted Taylor +2 more |
2020-12-22 |
| 10672500 |
Non-contact measurement of memory cell threshold voltage |
Amitava Majumdar, Rajesh Kamana, Hongmei Wang, Ervin T. Hill, Zengtao T. Liu +1 more |
2020-06-02 |
| 10650891 |
Non-contact electron beam probing techniques and related structures |
Amitava Majumdar, Rajesh Kamana, Hongmei Wang, Ervin T. Hill, Zengtao T. Liu +1 more |
2020-05-12 |
| 10403359 |
Non-contact electron beam probing techniques and related structures |
Amitava Majumdar, Rajesh Kamana, Hongmei Wang, Ervin T. Hill, Zengtao T. Liu +1 more |
2019-09-03 |
| 10381101 |
Non-contact measurement of memory cell threshold voltage |
Amitava Majumdar, Rajesh Kamana, Hongmei Wang, Ervin T. Hill, Zengtao T. Liu +1 more |
2019-08-13 |
| 8563435 |
Method of reducing damage to an electron beam inspected semiconductor substrate, and methods of inspecting a semiconductor substrate |
David Daycock, Paul A. Morgan, Curtis R. Olson |
2013-10-22 |
| 8334209 |
Method of reducing electron beam damage on post W-CMP wafers |
David Daycock, Paul A. Morgan, Curtis R. Olson |
2012-12-18 |
| 8026501 |
Method of removing or deposting material on a surface including material selected to decorate a particle on the surface for imaging |
Mark Williamson, Paul M. Johnson, Gurtej S. Sandhu, Justin R. Arrington |
2011-09-27 |
| 7791055 |
Electron induced chemical etching/deposition for enhanced detection of surface defects |
Mark Williamson, Paul M. Johnson, Gurtej S. Sandhu, Justin R. Arrington |
2010-09-07 |
| 6919612 |
Biasable isolation regions using epitaxially grown silicon between the isolation regions |
Darwin A. Clampitt, Regan Stanley Tsui |
2005-07-19 |
| 6716719 |
Method of forming biasable isolation regions using epitaxially grown silicon between the isolation regions |
Darwin A. Clampitt, Regan Stanley Tsui |
2004-04-06 |
