Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6114695 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada +3 more | 2000-09-05 |
| 5969357 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada +3 more | 1999-10-19 |
| 5866904 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada +3 more | 1999-02-02 |
| D381031 | Electron microscope | Tomoyuki Miyata, Atsushi Katayama, Daiji Tsuboi, Hiroyuki Kobayashi, Hisashi Sato +1 more | 1997-07-15 |
| 5594245 | Scanning electron microscope and method for dimension measuring by using the same | Hideo Todokoro, Kenji Takamoto, Tadashi Otaka, Fumio Mizuno, Satoru Yamada +3 more | 1997-01-14 |
| 5350918 | Transmission electron microscope | Hiroyuki Kobayashi, Morioki Kubozoe | 1994-09-27 |