Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7817845 | Multi-frequency image processing for inspecting parts having complex geometric shapes | Ui Suh, Gigi Gambrell, William Stewart McKnight, Peyush Kumar Mishra, Sandeep Kumar Dewangan +1 more | 2010-10-19 |
| 7689030 | Methods and apparatus for testing a component | Ui Suh, Gigi Gambrell, William Stewart McKnight | 2010-03-30 |
| 7233867 | Eddy current inspection method and system | Gigi Gambrell, Shyamsunder Tondanur Mandayam, Amitabha Dutta | 2007-06-19 |