Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11727556 | Defect detection for multi-die masks | Wenfei Gu, Weston L. Sousa | 2023-08-15 |
| 7027635 | Multiple design database layer inspection | Mark J. Wihl, George Chen, Jun Ye, Lih-Huah Yiin | 2006-04-11 |