Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11727556 | Defect detection for multi-die masks | Pei-Chun Chiang, Weston L. Sousa | 2023-08-15 |
| 10140698 | Polygon-based geometry classification for semiconductor mask inspection | Yin Xu, Rui-fang Shi | 2018-11-27 |