Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10146036 | Semiconductor wafer inspection using care area group-specific threshold settings for detecting defects | Ananthan Raghunathan, Vikas Sachan, Dmitry Vengertsev | 2018-12-04 |
| 9741581 | Using tensile mask to minimize buckling in substrate | Sunit S. Mahajan, Anne C. Friedman, Timothy A. Brunner, Shahrukh Khan | 2017-08-22 |