Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11983867 | Mask inspection of a semiconductor specimen | Ariel Shkalim, Vladimir OVECHKIN, Evgeny Bal, Ronen Madmon, Alexander Chereshnya +2 more | 2024-05-14 |
| 11348224 | Mask inspection of a semiconductor specimen | Ariel Shkalim, Vladimir OVECHKIN, Evgeny Bal, Ronen Madmon, Alexander Chereshnya +2 more | 2022-05-31 |
| 9927375 | System and method for printability based inspection | Shay Attal, Sergey Latinsky, Sergey Khristo, Boaz Cohen | 2018-03-27 |