Issued Patents All Time
Showing 25 most recent of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10354044 | Fragmentation point and simulation site adjustment for resolution enhancement techniques | James Word, Patrick J. LaCour | 2019-07-16 |
| 9857693 | Lithography model calibration via cache-based niching genetic algorithms | Huikan Liu, Konstantinos Adam | 2018-01-02 |
| 9703922 | Fragmentation point and simulation site adjustment for resolution enhancement techniques | James Word, Patrick J. LaCour | 2017-07-11 |
| 9361422 | Fragmentation point and simulation site adjustment for resolution enhancement techniques | James Word, Patrick J. LaCour | 2016-06-07 |
| 8566753 | Fragmentation point and simulation site adjustment for resolution enhancement techniques | James Word, Patrick J. LaCour | 2013-10-22 |
| 8533636 | Tolerable flare difference determination | Sergiy Komirenko, Raghu Chalasani | 2013-09-10 |
| 7945871 | Integrated OPC verification tool | Eugene Miloslavsky | 2011-05-17 |
| 7926002 | Selective optical proximity layout design data correction | James Word, Dragos Dudau | 2011-04-12 |
| 7861207 | Fragmentation point and simulation site adjustment for resolution enhancement techniques | James Word, Patrick J. LaCour | 2010-12-28 |
| 7434199 | Dense OPC | Dragos Dudau | 2008-10-07 |
| 7412676 | Integrated OPC verification tool | Eugene Miloslavsky | 2008-08-12 |
| 7367009 | Convergence technique for model-based optical and process correction | Emile Y. Sahouria | 2008-04-29 |
| 7324930 | Method and apparatus for performing OPC using model curvature | — | 2008-01-29 |
| 7240321 | Selective promotion for resolution enhancement techniques | Laurence W. Grodd, George P. Lippincott, Emile Y. Sahouria | 2007-07-03 |
| 7237221 | Matrix optical process correction | Yuri Granik | 2007-06-26 |
| 7234130 | Long range corrections in integrated circuit layout designs | James Word, Yuri Granik | 2007-06-19 |
| 7155699 | Streamlined IC mask layout optical and process correction through correction reuse | — | 2006-12-26 |
| 7073162 | Site control for OPC | Eugene Miloslavsky | 2006-07-04 |
| 7028284 | Convergence technique for model-based optical and process correction | Emile Y. Sahouria | 2006-04-11 |
| 7024655 | Mixed-mode optical proximity correction | — | 2006-04-04 |
| 7017141 | Integrated verification and manufacturability tool | Leigh Anderson, Laurence W. Grodd, Emile Y. Sahouria, Siqiong You | 2006-03-21 |
| 6928634 | Matrix optical process correction | Yuri Granik | 2005-08-09 |
| 6748578 | Streamlined IC mask layout optical and process correction through correction reuse | — | 2004-06-08 |
| 6668367 | Selective promotion for resolution enhancement techniques | Laurence W. Grodd, George P. Lippincott, Emile Y. Sahouria | 2003-12-23 |
| 6643616 | Integrated device structure prediction based on model curvature | Yuri Granik, Franklin Mark Schellenberg | 2003-11-04 |