Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12333695 | Sample observation system and image processing method | Minoru Harada, Yohei Minekawa | 2025-06-17 |
| 12260545 | Sample observation device and method | Yuki Doi, Minoru Harada, Hideki Nakayama, Yohei Minekawa, Yuji Takagi | 2025-03-25 |
| 12154264 | Defect inspecting system and defect inspecting method | Minoru Harada, Yohei Minekawa | 2024-11-26 |
| 11670528 | Wafer observation apparatus and wafer observation method | Minoru Harada, Yohei Minekawa, Takehiro Hirai | 2023-06-06 |
| 11170483 | Sample observation device and sample observation method | Minoru Harada, Yuji Takagi, Takehiro Hirai | 2021-11-09 |
| 11087454 | Defect observation device and defect observation method | Minoru Harada, Yuji Takagi, Takehiro Hirai | 2021-08-10 |
| 10977786 | Wafer observation device | Minoru Harada, Yuji Takagi, Takehiro Hirai | 2021-04-13 |
| 10971325 | Defect observation system and defect observation method for semiconductor wafer | Minoru Harada, Yuji Takagi, Takehiro Hirai, Yohei Minekawa | 2021-04-06 |
| 10810733 | Defect classification apparatus and defect classification method | Takehiro Hirai, Minoru Harada, Yuji Takagi | 2020-10-20 |
| 10559074 | Sample observation device and sample observation method | Minoru Harada, Yuji Takagi, Takehiro Hirai | 2020-02-11 |