MT

Minghao Tang

Globalfoundries: 6 patents #578 of 4,424Top 15%
CL Contemporary Amperex Technology Co., Limited: 2 patents #365 of 974Top 40%
CL Contemporary Amperex Technology (Hong Kong) Limited: 2 patents #166 of 684Top 25%
JL Jiangsu Contemporary Amperex Technology Limited: 2 patents #19 of 132Top 15%
GU Globalfoundries U.S.: 1 patents #344 of 665Top 55%
KL Kla: 1 patents #347 of 758Top 50%
Overall (All Time): #334,601 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12355027 Winding shaft, cell manufacturing apparatus, and cell manufacturing method Xiaowei Zhang, Jiang Lin, Wenfa Lin, Zhenqiang Cui, Shengwu Zhang 2025-07-08
12334492 Winding device, winding apparatus and winding method Xiaowei Zhang, Zhiwen Wang, Wei Zhang, Xiang Wu, Yuqian WEN +1 more 2025-06-17
12140413 Cell winding calibration method, apparatus, and device, and cell winding system Xiaowei Zhang, Zhiwen Wang, Wei Zhang, Yuqian WEN, Shengwu Zhang 2024-11-12
12002919 Winding shaft, cell manufacturing apparatus, and cell manufacturing method Xiaowei Zhang, Jiang Lin, Wenfa Lin, Zhenqiang Cui, Shengwu Zhang 2024-06-04
11996508 Winding shaft structure and winding apparatus Xiaowei Zhang, Jun Ni, Zhiwen Wang, Yuqian WEN, Chao Xie 2024-05-28
11675277 Self-referencing and self-calibrating interference pattern overlay measurement Dongyue Yang, Xintuo Dai, Dongsuk Park, Md Motasim Bellah, Pavan Kumar Chinthamanipeta Sripadarao +1 more 2023-06-13
11476492 Device for preparing electrode assembly and preparation method of electrode assembly Chengdu Liang, Yiruo WANG, Chao-Kuang Yang, Xiao Wang, Jiang-Jen Lin +1 more 2022-10-18
11231654 Self-referencing and self-calibrating interference pattern overlay measurement Dongyue Yang, Xintuo Dai, Dongsuk Park, Md Motasim Bellah, Pavan Kumar Chinthamanipeta Sripadarao +1 more 2022-01-25
10833022 Structure and method to improve overlay performance in semiconductor devices Cung D. Tran, Huaxiang Li, Bradley Morgenfeld, Xintuo Dai, Sanggil Bae +7 more 2020-11-10
10707175 Asymmetric overlay mark for overlay measurement Wei Zhao, Rui Chen, Dongyue Yang, Haiting Wang, Erik Geiss +1 more 2020-07-07
10705435 Self-referencing and self-calibrating interference pattern overlay measurement Dongyue Yang, Xintuo Dai, Dongsuk Park, Md Motasim Bellah, Pavan Kumar Chinthamanipeta Sripadarao +1 more 2020-07-07
10504851 Structure and method to improve overlay performance in semiconductor devices Cung D. Tran, Huaxiang Li, Bradley Morgenfeld, Xintuo Dai, Sanggil Bae +7 more 2019-12-10
10395926 Multiple patterning with mandrel cuts formed using a block mask Yuping Ren, Sean Xuan Lin, Shao Beng Law, Genevieve Beique, Xun XIANG +1 more 2019-08-27
10319626 Interconnects with cuts formed by block patterning Rui Chen, Yuping Ren 2019-06-11