Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7426669 | Circuit arrangement and method for driving electronic chips | Bjorn Flach, Andreas Logisch, Wolfgang Ruf, Martin Schnell | 2008-09-16 |
| 7117403 | Method and device for generating digital signal patterns | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2006-10-03 |
| 7117404 | Test circuit for testing a synchronous memory circuit | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Peter Poechmüller +1 more | 2006-10-03 |
| 7062690 | System for testing fast synchronous digital circuits, particularly semiconductor memory chips | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2006-06-13 |
| 6957373 | Address generator for generating addresses for testing a circuit | Wolfgang Ernst, Justus Kuhn, Jens Luepke, Peter Poechmüller, Gunnar Krause +1 more | 2005-10-18 |
| 6897646 | Method for testing wafers to be tested and calibration apparatus | Thomas Grebner, Hans-Christoph Ostendorf, Erwin Thalmann | 2005-05-24 |
| 6871306 | Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2005-03-22 |
| 6865707 | Test data generator | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Luepke, Jochen Mueller +1 more | 2005-03-08 |
| 6862702 | Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2005-03-01 |
| 6839397 | Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2005-01-04 |
| 6744272 | Test circuit | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Luepke, Jochen Mueller +1 more | 2004-06-01 |
| 6724181 | Method of calibrating a test system for semiconductor components, and test substrate | — | 2004-04-20 |
| 6721904 | System for testing fast integrated digital circuits, in particular semiconductor memory modules | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2004-04-13 |
| 6618305 | Test circuit for testing a circuit | Wolfgang Ernst, Gunnar Krause, Peter Poechmueller, Justus Kuhn, Jens Luepke +1 more | 2003-09-09 |
| 6556492 | System for testing fast synchronous semiconductor circuits | Wolfgang Ernst, Gunnar Krause, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2003-04-29 |
| 6515319 | Field-effect-controlled transistor and method for fabricating the transistor | Dietrich Widmann, Armin Wieder, Justus Kuhn, Jens Lüpke, Jochen Müller +1 more | 2003-02-04 |