Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12368223 | Fault protected signal splitter apparatus | John B. Putman, Matthew C. Putman, Damas Limoge, Joanna Lee | 2025-07-22 |
| 11995802 | System, method and apparatus for macroscopic inspection of reflective specimens | Matthew C. Putman, John B. Putman, John Moffitt, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2024-05-28 |
| 11961210 | System, method and apparatus for macroscopic inspection of reflective specimens | Jonathan Lee, Damas Limoge, Matthew C. Putman, John B. Putman | 2024-04-16 |
| 11955686 | Fault protected signal splitter apparatus | John B. Putman, Matthew C. Putman, Damas Limoge, Jonathan Lee | 2024-04-09 |
| 11894596 | Fault protected signal splitter apparatus | John B. Putman, Matthew C. Putman, Damas Limoge, Jonathan Lee | 2024-02-06 |
| 11784386 | Fault protected signal splitter apparatus | John B. Putman, Matthew C. Putman, Damas Limoge, Jonathan Lee | 2023-10-10 |
| 11663703 | System, method and apparatus for macroscopic inspection of reflective specimens | Matthew C. Putman, John B. Putman, John Moffitt, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2023-05-30 |
| 11656184 | Macro inspection systems, apparatus and methods | Matthew C. Putman, John B. Putman, John Moffitt, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2023-05-23 |
| 11593919 | System, method and apparatus for macroscopic inspection of reflective specimens | Jonathan Lee, Damas Limoge, Matthew C. Putman, John B. Putman | 2023-02-28 |
| 11411293 | Fault protected signal splitter apparatus | John B. Putman, Matthew C. Putman, Damas Limoge, Jonathan Lee | 2022-08-09 |
| 11408829 | Macro inspection systems, apparatus and methods | Matthew C. Putman, John B. Putman, John Moffitt, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2022-08-09 |
| 11341617 | System, method and apparatus for macroscopic inspection of reflective specimens | Matthew C. Putman, John B. Putman, John Moffitt, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2022-05-24 |
| 11125677 | Systems, devices, and methods for combined wafer and photomask inspection | Randolph E. Griffith, Jeff Andresen, Scott Pozzi-Loyola, Steve Scranton, Alejandro S. Jaime +1 more | 2021-09-21 |
| 10914686 | Macro inspection systems, apparatus and methods | Matthew C. Putman, John B. Putman, John Moffitt, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2021-02-09 |
| 10915992 | System, method and apparatus for macroscopic inspection of reflective specimens | Matthew C. Putman, John B. Putman, John Moffitt, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2021-02-09 |
| 10545096 | Marco inspection systems, apparatus and methods | Matthew C. Putman, John B. Putman, John Moffitt, Jeffrey Andresen, Scott Pozzi-Loyola +1 more | 2020-01-28 |
| 10254214 | Systems, devices, and methods for combined wafer and photomask inspection | Randolph E. Griffith, Jeff Andresen, Scott Pozzi-Loyola, Steve Scranton, Alejandro S. Jaime +1 more | 2019-04-09 |