Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5889788 | Wrapper cell architecture for path delay testing of embedded core microprocessors and method of operation | Grady L. Giles, Alfred L. Crouch | 1999-03-30 |
| 5812561 | Scan based testing of an integrated circuit for compliance with timing specifications | Grady L. Giles, Alfred L. Crouch, Odis Dale Amason, Jr., Clark Gilson Shepard, Michael Alan Mateja +3 more | 1998-09-22 |
| 5774476 | Timing apparatus and timing method for wrapper cell speed path testing of embedded cores within an integrated circuit | Grady L. Giles | 1998-06-30 |
| 5717700 | Method for creating a high speed scan-interconnected set of flip-flop elements in an integrated circuit to enable faster scan-based testing | Alfred L. Crouch, Bernard J. Pappert | 1998-02-10 |
| 5617531 | Data Processor having a built-in internal self test controller for testing a plurality of memories internal to the data processor | Alfred L. Crouch, James G. Gay, Clark Gilson Shepard, Pamela S. Laakso | 1997-04-01 |
| 5592493 | Serial scan chain architecture for a data processing system and method of operation | Alfred L. Crouch, Joseph C. Circello, Richard Duerden | 1997-01-07 |
| 5383143 | Self re-seeding linear feedback shift register (LFSR) data processing system for generating a pseudo-random test bit stream and method of operation | Alfred L. Crouch | 1995-01-17 |