Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7356742 | Method and apparatus for testing a memory device in quasi-operating conditions | Hideyuki Aoki, Takeshi Wada, Masaaki Namba, Noboru Uchida, Shigeki Katsumi +1 more | 2008-04-08 |
| 6138257 | IC testing apparatus and method | Yuji Wada, Kaoru Fukuda, Yoshio Kamiko | 2000-10-24 |