Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6138257 | IC testing apparatus and method | Yuji Wada, Kaoru Fukuda, Masaaki Mochiduki | 2000-10-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6138257 | IC testing apparatus and method | Yuji Wada, Kaoru Fukuda, Masaaki Mochiduki | 2000-10-24 |