Issued Patents All Time
Showing 25 most recent of 30 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12340838 | Drive circuit with improved timing margin for memory device | Yoshisato Yokoyama, Yorinobu Fujino | 2025-06-24 |
| 12317521 | Capacitor device and manufacturing method therefor | Yoshitaka Fujiishi, Wenliang Chen | 2025-05-27 |
| 12074103 | Circuit assembly | Wenliang Chen, Jun Gu, Takashi Kubo, Chien-An Yu, Chun-Yi Lin | 2024-08-27 |
| 11417628 | Method for manufacturing semiconductor structure | Wenliang Chen, Jun Gu, Takashi Kubo, Chien-An Yu, Chun-Yi Lin | 2022-08-16 |
| 11380614 | Circuit assembly | Wenliang Chen, Jun Gu, Takashi Kubo, Chien-An Yu, Chun-Yi Lin | 2022-07-05 |
| 11200945 | Semiconductor memory device | Takashi Kubo, Takeshi Hamamoto, Kenichi Yasuda, Yasuhiko Tsukikawa, Hironori Iga | 2021-12-14 |
| 11038012 | Capacitor device and manufacturing method therefor | Yoshitaka Fujiishi | 2021-06-15 |
| 10991418 | Semiconductor memory device comprising an interface conforming to JEDEC standard and control device therefor | Takashi Kubo, Yasuhiko Tsukikawa, Hironori Iga, Kenichi Yasuda, Takeshi Hamamoto | 2021-04-27 |
| 10978413 | Circuit system having compact decoupling structure | Yoshitaka Fujiishi | 2021-04-13 |
| 10818337 | Semiconductor memory device for preventing occurrence of row hammer issue | Bunsho Kuramori, Mineo Noguchi, Akihiro Hirota, Masahiro Ishihara, Mitsuru Yoneyama +3 more | 2020-10-27 |
| 9921638 | Data processing system with selective engagement of standby mode based on comparison with a break-even time | Isamu Hayashi, Hiroyuki Kawai, Hideyuki Noda | 2018-03-20 |
| 9558151 | Data processing device and data processing method thereof | Kan Murata, Hideyuki Noda | 2017-01-31 |
| 9360922 | Data processing system, microcontroller and semiconductor device | Isamu Hayashi, Hiroyuki Kawai | 2016-06-07 |
| 7983112 | Semiconductor device which transmits or receives a signal to or from an external memory by a DDR system | Tokuya Osawa | 2011-07-19 |
| 7724606 | Interface circuit | Tokuya Osawa, Yoshikazu Morooka, Hiroshi Kinoshita | 2010-05-25 |
| 7535251 | Semiconductor device and impedance adjusting method thereof | Chikayoshi Morishima, Tokuya Osawa, Yoshihiro Yamashita | 2009-05-19 |
| 7433251 | Semiconductor memory device storing redundant replacement information with small occupation area | Takeshi Fujino | 2008-10-07 |
| 7254069 | Semiconductor memory device storing redundant replacement information with small occupation area | Takeshi Fujino | 2007-08-07 |
| 7064993 | Semiconductor memory device with common I/O type circuit configuration achieving write before sense operation | Takayuki Gyohten, Fukashi Morishita | 2006-06-20 |
| 7007215 | Test circuit capable of testing embedded memory with reliability | Mitsuya Kinoshita, Tetsushi Tanizaki, Katsumi Dosaka | 2006-02-28 |
| 6930940 | Semiconductor memory device with read and/or write column select gate | — | 2005-08-16 |
| 6781903 | Semiconductor memory device with power consumption reduced in non-data-access | Atsuo Mangyo, Akira Yamazaki | 2004-08-24 |
| 6779139 | Circuit for reducing test time and semiconductor memory device including the circuit | Katsumi Dosaka, Tetsushi Tanizaki | 2004-08-17 |
| 6704229 | Semiconductor test circuit for testing a semiconductor memory device having a write mask function | Tetsushi Tanizaki | 2004-03-09 |
| 6650583 | Test circuit device capable of identifying error in stored data at memory cell level and semiconductor integrated circuit device including the same | Katsumi Dosaka | 2003-11-18 |