MH

Maximilian Haider

Applied Materials: 5 patents #2,165 of 7,310Top 30%
CG Carl Zeiss Microscopy Gmbh: 3 patents #151 of 564Top 30%
CA Carl Ziess Smt Ag: 2 patents #1 of 34Top 3%
CG Ceos Corrected Electron Optical Systems Gmbh: 1 patents #6 of 10Top 60%
Overall (All Time): #570,822 of 4,157,543Top 15%
9
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10504681 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Oliver Kienzle, Thomas Kemen, Heiko Mueller, Stephan Uhlemann +2 more 2019-12-10
9673024 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Oliver Kienzle, Thomas Kemen, Heiko Mueller, Stephan Uhlemann +2 more 2017-06-06
9224576 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Oliver Kienzle, Thomas Kemen, Heiko Mueller, Stephan Uhlemann +2 more 2015-12-29
8097847 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Oliver Kienzle, Thomas Kemen, Heiko Mueller, Stephan Uhlemann +1 more 2012-01-17
7554094 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Rainer Knippelmeyer, Oliver Kienzle, Thomas Kemen, Heiko Mueller, Stephan Uhlemann +1 more 2009-06-30
6770878 Electron/ion gun for electron or ion beams with high monochromasy or high current density Stephan Uhlemann 2004-08-03
6646267 Method for eliminating first, second and third-order axial image deformations during correction of the third-order spherical aberration in electron optical systems Stephan Uhlemann 2003-11-11
6605810 Device for correcting third-order spherical aberration in a lens, especially the objective lens of an electronic microscope Stephan Uhlemann 2003-08-12
5021670 Multipole element Stephan Lanio 1991-06-04