| 11378620 |
Method and system for detecting abnormal die |
Shou-Kang Fan |
2022-07-05 |
| 11195592 |
Memory inspecting method and memory inspecting system |
Pailu Wang |
2021-12-07 |
| 9153344 |
Device for detecting defective global word line |
Hung-Wen Chang |
2015-10-06 |
| 8773931 |
Method of detecting connection defects of memory and memory capable of detecting connection defects thereof |
Min-Chih Chang, Shih-Hsing Wang, Te-Yi Yu |
2014-07-08 |
| 8543877 |
Method of performing a chip burn-in scanning with increased efficiency |
Wei-Ju Chen, Shi-Huei Liu |
2013-09-24 |
| 7965577 |
Word line defect detecting device and method thereof |
Wei-Jen Chen, Ho-Yin Chen, Shu-Jen Wu |
2011-06-21 |
| 7623388 |
Method for detecting erroneous word lines of a memory array and device thereof |
Tzu-Hao Chen, Jen-Shou Hsu, Yin-Ming Lan |
2009-11-24 |