Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8922232 | Test-use individual substrate, probe, and semiconductor wafer testing apparatus | Shigeru Matsumura, Kohei Kato, Katsushi Sugai, Mitsutoshi Higashi, Akinori Shiraishi +1 more | 2014-12-30 |