Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12423941 | Image recognition system | Toshinori Yamauchi, Masayoshi Ishikawa, Takefumi KAKINUMA, Masaki Hasegawa, Yasutaka Toyoda | 2025-09-23 |
| 11193895 | Semiconductor substrate for evaluation and method using same to evaluate defect detection sensitivity of inspection device | Masaki Hasegawa, Tomohiko Ogata, Katsunori Onuki, Noriyuki Kaneoka | 2021-12-07 |