Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8917566 | Bypass structure for a memory device and method to reduce unknown test values | Aaron Cummings, Michael T. Fragano, Kevin W. Gorman, Michael R. Ouellette | 2014-12-23 |
| 7734968 | Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit) | Richard J. Grupp, Mark R. Taylor | 2010-06-08 |
| 7308630 | Mechanism to provide test access to third-party macro circuits embedded in an ASIC (application-specific integrated circuit) | Richard J. Grupp, Mark R. Taylor | 2007-12-11 |
| 6882159 | Associated grouping of embedded cores for manufacturing test | Bruce Cowan, Jessica H. Pratt, Mark R. Taylor | 2005-04-19 |