Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12019956 | Subsampling method for converting 3D scan data of an object for marine, civil, and architectural works into smaller densities for processing without CAD processing | Evan Wingfield, Sophia Simpkins, Michael T. Monahan | 2024-06-25 |
| 11544419 | Subsampling method for converting 3D scan data of an object for marine, civil, and architectural works into smaller densities for processing without CAD processing | Evan Wingfield, Sophia Simpkins, Michael T. Monahan | 2023-01-03 |
| 7678516 | Test structures and methods for monitoring or controlling a semiconductor fabrication process | Brad Eichelberger, Ady Levy | 2010-03-16 |
| 7557921 | Apparatus and methods for optically monitoring the fidelity of patterns produced by photolitographic tools | Michael Adel, Moshe E. Preil, Christopher F. Bevis, Ben-ming Benjamin Tsai, Mark Ghinovker | 2009-07-07 |