Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11788974 | Control apparatus, system, method, and program | Shintaro Kobayashi, Hisashi Konaka | 2023-10-17 |
| 10837923 | X-ray analysis device and method for optical axis alignment thereof | Shintaro Kobayashi, Toru Mitsunaga | 2020-11-17 |
| 10585053 | X-ray diffractometer | Shintaro Kobayashi | 2020-03-10 |
| 10444168 | Method and apparatus for measuring bowing of single-crystal substrate | Shintaro Kobayashi, Toru Mitsunaga | 2019-10-15 |
| 9218315 | X-ray analysis apparatus | Toru Mitsunaga, Keiichi Morikawa | 2015-12-22 |
| 9086367 | X-ray intensity correction method and X-ray diffractometer | Toru Mitsunaga, Kazuhiko Omote | 2015-07-21 |
| 9074992 | X-ray diffraction apparatus and X-ray diffraction measurement method | Tetsuya Ozawa, Ryuji Matsuo | 2015-07-07 |
| 7684543 | X-ray beam conditioning device and X-ray analysis apparatus | Ryuji Matsuo, Tetsuya Ozawa, Makoto Aoyagi | 2010-03-23 |
| 7680246 | Method and device for judging polarity of single crystal sample | — | 2010-03-16 |
| 6999557 | Method of setting measuring range of reciprocal-space mapping | Susumu Yamaguchi, Tetsuya Ozawa, Ryuji Matsuo | 2006-02-14 |
| 6970532 | Method and apparatus for measuring thin film, and thin film deposition system | Seiichi Hayashi, Jimpei Harada, Tetsuo Kikuchi, Kazuhiko Omote | 2005-11-29 |
| 5063489 | Switching regulator having improved switching control arrangement | — | 1991-11-05 |