| 7183791 |
Reliability circuit for applying an AC stress signal or DC measurement to a transistor device |
SangJune Park, Richard T. Schultz |
2007-02-27 |
| 7176082 |
Analog capacitor in dual damascene process |
Todd A. Randazzo, Kenneth P. Fuchs |
2007-02-13 |
| 6855586 |
Low voltage breakdown element for ESD trigger device |
Todd A. Randazzo |
2005-02-15 |
| 6822282 |
Analog capacitor in dual damascene process |
Todd A. Randazzo, Kenneth P. Fuchs |
2004-11-23 |
| 6710990 |
Low voltage breakdown element for ESD trigger device |
Todd A. Randazzo |
2004-03-23 |
| 6596579 |
Method of forming analog capacitor dual damascene process |
Todd A. Randazzo, Kenneth P. Fuchs |
2003-07-22 |
| 6130117 |
Simple bicmos process for creation of low trigger voltage SCR and zener diode pad protection |
Todd A. Randazzo, Gayle W. Miller |
2000-10-10 |
| 5966599 |
Method for fabricating a low trigger voltage silicon controlled rectifier and thick field device |
David W. Daniel |
1999-10-12 |
| 5821572 |
Simple BICMOS process for creation of low trigger voltage SCR and zener diode pad protection |
Todd A. Randazzo, Gayle W. Miller |
1998-10-13 |
| 5498892 |
Lightly doped drain ballast resistor |
Samuel C. Gioia |
1996-03-12 |
