Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6860136 | Method and apparatus for measuring physical properties of matter | Barry N. Lucas | 2005-03-01 |
| 6718832 | Method and apparatus for measuring physical properties of matter | Barry N. Lucas | 2004-04-13 |
| 6640459 | Multidimensional contact mechanics measurement system | Barry N. Lucas | 2003-11-04 |
| 6637265 | Apparatus for measuring physical properties of matter | Barry N. Lucas | 2003-10-28 |
| 6486557 | Hybrid dielectric structure for improving the stiffness of back end of the line structures | Charles R. Davis, Daniel C. Edelstein, Jeffrey Hedrick, Christopher V. Jahnes, Vincent J. McGahay +1 more | 2002-11-26 |
| 6455443 | Method of fabricating low-dielectric constant interlevel dielectric films for BEOL interconnects with enhanced adhesion and low-defect density | Andrew Robert Eckert, Jeffrey Hedrick, Kang-Wook Lee, Eric G. Liniger, Eva E. Simonyi | 2002-09-24 |