JF

John Flanagan

FE Fei: 7 patents #78 of 681Top 15%
Overall (All Time): #681,305 of 4,157,543Top 20%
7
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12362137 Automated sample alignment for microscopy Michael Strauss 2025-07-15
12293525 Artificial intelligence enabled metrology Brad Larson, Thomas G. Miller 2025-05-06
11847813 Artificial intelligence-enabled preparation end-pointing Thomas G. Miller, Brian Roberts Routh, Jr., Richard Young, Brad Larson, Aditee Shrotre 2023-12-19
11569056 Parameter estimation for metrology of features in an image Brad Larson, Maurice Peemen 2023-01-31
11176656 Artificial intelligence-enabled preparation end-pointing Thomas G. Miller, Brian Roberts Routh, Jr., Richard Young, Brad Larson, Aditee Shrotre 2021-11-16
11151356 Using convolution neural networks for on-the-fly single particle reconstruction Erik Franken, Maurice Peemen 2021-10-19
9978557 System for orienting a sample using a diffraction pattern 2018-05-22