| 10101386 |
Real time semiconductor process excursion monitor |
Kenneth M. Butler |
2018-10-16 |
| 9714966 |
Circuit aging sensor |
Min Chen, Vijay Reddy |
2017-07-25 |
| 9275747 |
Integrated circuit with automatic total ionizing dose (TID) exposure deactivation |
Robert Baumann |
2016-03-01 |
| 8689168 |
Reliability determination taking into account effect of component failures on circuit operation |
Robert Baumann |
2014-04-01 |
| 8126681 |
Semiconductor outlier identification using serially-combined data transform processing methodologies |
Amit Nahar, Kenneth M. Butler, Thomas Anderson, Suresh Subramaniam |
2012-02-28 |
| 7865849 |
System and method for estimating test escapes in integrated circuits |
Kenneth M. Butler, Jayashree Saxena, Amit P. Vasavada |
2011-01-04 |
| 7494829 |
Identification of outlier semiconductor devices using data-driven statistical characterization |
Suresh Subramaniam, Amit Nahar, Thomas Anderson, Kenneth M. Butler |
2009-02-24 |
| 7292058 |
Method for estimating the early failure rate of semiconductor devices |
Thomas Anderson |
2007-11-06 |
| 7129735 |
Method for test data-driven statistical detection of outlier semiconductor devices |
Suresh Subramaniam, Kenneth M. Butler, Richard Anthony Lawrence |
2006-10-31 |