Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7337098 | Diffraction condition simulation device, diffraction measurement system, and crystal analysis system | Ryouichi Yokoyama, Kamihisa Endo, Tetsuya Ozawa | 2008-02-26 |
| 7280634 | Beam conditioning system with sequential optic | Boris Verman | 2007-10-09 |
| 7076026 | Beam conditioning system | Boris Verman | 2006-07-11 |
| 6970532 | Method and apparatus for measuring thin film, and thin film deposition system | Seiichi Hayashi, Tetsuo Kikuchi, Kazuhiko Omote, Katsuhiko Inaba | 2005-11-29 |
| 6823042 | Apparatus for X-ray analysis and apparatus for supplying X-rays | Seiichi Hayashi, Sadayuki Takahashi, Masaru Kuribayashi | 2004-11-23 |
| 6813338 | Method for measuring powder x-ray diffraction data using one-or-two-dimensional detector | Masaki Takata, Eiji Nishibori, Makoto Sakata | 2004-11-02 |
| 6385281 | Fluorescent x-ray analyzing method and apprartus | Tetsuya Ozawa, Kazuhiko Omote | 2002-05-07 |
| 6249566 | Apparatus for x-ray analysis | Seiichi Hayashi, Kazuhiko Omote | 2001-06-19 |
| 6198796 | Method and apparatus of automatically selecting bragg reflections, method and system of automatically determining crystallographic orientation | Ryoichi Yokoyama | 2001-03-06 |